Publications

Summary: IEEE TCAD (30), DAC (20), ICCAD (20), etc.

Journal & Conference Papers

Accepted

  • [J55] Ran Chen, Wei Zhong, Haoyu Yang, Hao Geng, Fan Yang, Xuan Zeng, Bei Yu, “Faster Region-based Hotspot Detection”, accepted by IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD).

2021

  • [C110] Zhuolun He, Peiyu Liao, Siting Liu, Yuzhe Ma, Bei Yu, “Physical Synthesis for Advanced Neural Network Processors”, IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), Jan. 18–21, 2021. (Invited Paper)

  • [C109] Wei Li, Yuxiao Qu, Gengjie Chen, Yuzhe Ma, Bei Yu, “TreeNet: Deep Point Cloud Embedding for Routing Tree Construction”, IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), Jan. 18–21, 2021.

  • [C108] Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu, “Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks”, IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), Jan. 18–21, 2021.

  • [C107] Haoyu Yang, Shifan Zhang, Kang Liu, Siting Liu, Benjamin Tan, Ramesh Karri, Siddharth Garg, Bei Yu, Evangeline F.Y. Young, “Attacking a CNN-based Layout Hotspot Detector Using Group Gradient Method”, IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), Jan. 18–21, 2021.

2020


  • [C106] Hao Geng, Haoyu Yang, Lu Zhang, Jin Miao, Fan Yang, Xuan Zeng, Bei Yu, “Hotspot Detection via Attention-based Deep Layout Metric Learning”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2–5, 2020. (paper)

  • [C105] Qi Sun, Arjun Ashok Rao, Xufeng Yao, Bei Yu, Shiyan Hu, “Counteracting Adversarial Attack in Autonomous Driving”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2–5, 2020. (paper) (Invited Paper)

  • [C104] Guojin Chen, Wanli Chen, Yuzhe Ma, Haoyu Yang, Bei Yu, “DAMO: Deep Agile Mask Optimization for Full Chip Scale”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2–5, 2020. (paper)

  • [C103] Bentian Jiang, Lixin Liu, Yuzhe Ma, Hang Zhang, Evangeline F. Y. Young, Bei Yu, “Neural-ILT: Migrating ILT to Nerual Networks for Mask Printability and Complexity Co-optimizaton”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2–5, 2020. (paper)

  • [C102] Zhuolun He, Lu Zhang, Peiyu Liao, Yuzhe Ma, Bei Yu, “Reinforcement Learning Driven Physical Synthesis”, IEEE International Conference on Solid -State and Integrated Circuit Technology (ICSICT), Kunming, Nov. 3–6, 2020. (paper) (Invited Paper)

  • [C101] Zhuolun He, Yuzhe Ma, Lu Zhang, Peiyu Liao, Ngai Wong, Bei Yu, Martin D. F. Wong, “Learn to Floorplan through Acquisition of Effective Local Search Heuristics”, IEEE International Conference on Computer Design (ICCD), Oct. 18–21, 2020. (paper)

  • [C100] Wanli Chen, Xinge Zhu, Ruoqi Sun, Junjun He, Ruiyu Li, Xiaoyong Shen, Bei Yu, “Tensor Low-Rank Reconstruction for Semantic Segmentation”, European Conference on Computer Vision (ECCV), August 23–28, 2020. (paper) (slides) (code)

  • [C99] Ran Chen, Yong Liu, Mengdan Zhang, Shu Liu, Bei Yu, Yu-Wing Tai, “Dive Deeper Into Box for Object Detection”, European Conference on Computer Vision (ECCV), August 23–28, 2020. (paper) (slides)

  • [C98] Wei Li, Jialu Xia, Yuzhe Ma, Jialu Li, Yibo Lin, Bei Yu, “Adaptive Layout Decomposition with Graph Embedding Neural Networks”, ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, July 19–23, 2020. (paper) (slides)

  • [C97] Wei Zhong, Shuxiang Hu, Yuzhe Ma, Haoyu Yang, Xiuyuan Ma, Bei Yu, “Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization”, ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, July 19–23, 2020. (paper) (slides)

  • [C96] Husheng Zhou, Wei Li, Zelun Kong, Junfeng Guo, Yuqun Zhang, Bei Yu, Lingming Zhang, Cong Liu, “DeepBillboard: Systematic Physical-World Testing of Autonomous Driving Systems”, ACM/IEEE International Conference on Software Engineering (ICSE), Seoul, May 23–29, 2020. (arXiv)

  • [C95] Junpeng Wang, Qi Xu, Bo Yuan, Song Chen, Bei Yu, Feng Wu, “Reliability-Driven Neural Network Training for Memristive Crossbar-Based Neuromorphic Computing Systems”, IEEE International Symposium on Circuits and Systems (ISCAS), Sevilla, Spain, May 17–20, 2020. (paper)

2019


  • [C80] Bentian Jiang, Xiaopeng Zhang, Ran Chen, Gengjie Chen, Peishan Tu, Wei Li, Evangeline F. Y. Young, Bei Yu, “FIT: Fill Insertion Considering Timing”, ACM/IEEE Design Automation Conference (DAC), pp. 221:1–221:6, Las Vegas, NV, June 2–6, 2019. (paper) (slides) (poster)

2018


2017


  • [C57] Hang Zhang, Fengyuan Zhu, Haocheng Li, Evangeline F. Y. Young, Bei Yu, “Bilinear Lithography Hotspot Detection”, ACM International Symposium on Physical Design (ISPD), pp. 7–14, Portland, OR, Mar. 19–22, 2017. (paper) (Best Paper Award)

2016


2015


2014

2013


2012


  • [C13] Bei Yu, Jhih-Rong Gao, Duo Ding, Yongchan Ban, Jae-Seok Yang, Kun Yuan, Minsik Cho, David Z. Pan, “Dealing with IC Manufacturability in Extreme Scaling”, IEEE/ACM International Conference on Computer-Aided Design (ICCAD), pp. 240–242, San Jose, CA, Nov. 5–8, 2012. (paper) (Embedded Tutorial paper)

2011

2010

2009



Books / Book Chapters

 

[B3] Shiyan Hu, Bei Yu, “Big Data Analytics for Cyber-Physical Systems”, Springer, 2020.

 

[B2] Bei Yu, David Z. Pan, “Design for Manufacturability with Advanced Lithography”, Springer, 2016.

 

[B1] Bei Yu, David Z. Pan, “Layout Decomposition for Triple Patterning”, in Encyclopedia of Algorithms, M.-Y. Kao eds., Springer, 2015. (paper)


Dissertation

Newsletters

  • [N2] Bei Yu, Gilda Garreton, David Z. Pan, “Layout Compliance for Triple Patterning Lithography: An Iterative Approach”, SPIE Newsroom.