| Title: | Adaptive Test, Part of the End-to-End Test Connecting Chip Manufacturers to System Production |
| Date: |
July 8, 2010 (Thursday)
|
| Time: |
10:30 a.m. - 11:30 a.m.
|
| Venue: |
Room 121, 1/F, Ho Sin-hang Engineering Building,
The Chinese University of Hong Kong, Shatin, N.T. |
| Speaker: |
Dr. Xinli Gu
Director Advanced Technology Group Cisco Systems, Inc. |
The purpose of adaptive test is to improve test quality while constraining or even improving test costs. This presentation talks about using the adaptive concept in an end-to-end test environment. It includes not only the ASIC/chip level test, but also system/board level test. As a result, the adaptive concept is implemented by a loopback at ASIC/chip level, a loopback at system/board level, as well as a loopback across the system/board level to ASIC/chip level. It also includes data monitor to determine the effectiveness of the test and a test suite or new test development for test effectiveness improvement. We will use industrial examples to demonstrate the best practice and results.
BIOGRAPHY:
Xinli Gu is a director of Advanced Technology Group, Cisco Systems, Inc. He leads a large globalized team (SJ USA, RTP USA, Bangalore India, Chennai India and Shanghai China) within Cisco responsible for company-wide product manufacturing test quality and in-field reliability. He has a PhD in computer science from Linkoping University, Linkoping, Sweden.
Enquiries: Miss Temmy So at tel 2609 8444
For more information, please refer to http://www.cse.cuhk.edu.hk/seminar