Title:	Introduction to Post-Silicon Validation and Recent Advancements
Date:	January 7, 2009 (Wednesday)
Time:	11:30 a.m. - 12:30 p.m.
Venue:	Room 121, 1/F, Ho Sin-hang Engineering Building, The Chinese University of Hong Kong, Shatin, N.T.
Speaker:	Mr. Ho Fai (Henry) Ko PhD candidate Department of Electrical and Computer Engineering McMaster University Canada

ABSTRACT:

To identify design errors that escape pre-silicon verification, post-silicon validation and debug is becoming an important step in the implementation flow of digital integrated circuits. While many debug problems are tackled on testers, there are hard-to-find design errors that are activated only in-system. A key challenge during in-system debugging is to acquire data from internal circuit's nodes in real-time. In this talk we discuss several basic techniques used for data acquisition during post-silicon validation and debug, as well as some recent research on improving real-time observability.

BIOGRAPHY:

Ho Fai (Henry) Ko received his M.A.Sc. degree in 2004 from the Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada, where he is also working toward his Ph.D. degree. His research interests are in the area of computer-aided design with special emphasis on test and debug.

Enquiries: Miss Temmy So at tel 2609 8444

For more information, please refer to http://www.cse.cuhk.edu.hk/seminar