|Title:||Machine Learning and Pattern Matching in VLSI CAD|
|Date:||January 18, 2015 (Monday)|
|Time:||11:00 a.m. - 12:00 noon|
|Venue:||Room 121, 1/F, Ho Sin-hang Engineering Building,
The Chinese University of Hong Kong,
|Speaker:||Professor David Z. Pan
Department of Electrical and Computer Engineering
The University of Texas at Austin
Machine learning and pattern matching are powerful computer science techniques which can derive knowledge from big data, and make prediction. Since nanometer VLSI design and manufacturing have extremely high complexity and gigantic data, there has been a surge recently in applying and adapting machine learning and pattern matching techniques in VLSI physical design and verification, e.g., lithography hotspot detection and data/pattern-driven physical design, as they can raise the level of abstraction from detailed physics-based simulations and provide reasonably good quality-of-result. This talk will discuss some key techniques and recent results of machine learning and pattern matching with their applications in VLSI.
David Z. Pan received his BS degree from Peking University, and MS/PhD degrees from UCLA. He was a Research Staff Member at IBM T. J. Watson Research Center from 2000 to 2003. He is currently the Engineering Foundation Professor at the Department of Electrical and Computer Engineering, The University of Texas at Austin. He has published over 230 refereed journal and conference papers. He has served in many journal editorial boards (TCAD, TVLSI, TCAD-I, TCAS-II, TODAES, SCIS, JCST, etc.) and conference organizing/program committees (DAC, ICCAD, DATE, ASPDAC, ISLPED, ISPD, etc.). He is a working group member of the International Technology Roadmap for Semiconductor (ITRS). He has received a number of awards, including the SRC 2013 Technical Excellence Award, DAC Top 10 Author Award in Fifth Decade, DAC Prolific Author Award, ASPDAC Frequently Cited Author Award, 12 Best Paper Awards (ISPD 2014, ICCAD 2013, ASPDAC 2012, ISPD 2011, IBM Research 2010 Pat Goldberg Memorial Best Paper Award in CS/EE/Math, ASPDAC 2010, DATE 2009, ICICDT 2009, SRC Techcon in 1998, 2007, 2012 and 2015), Communications of the ACM Research Highlights (2014), ACM/SIGDA Outstanding New Faculty Award (2005), NSF CAREER Award (2007), SRC Inventor Recognition Award three times, IBM Faculty Award four times, UCLA Engineering Distinguished Young Alumnus Award (2009), ISPD Routing Contest Awards (2007), eASIC Placement Contest Grand Prize (2009), ICCAD'12 and ICCAD'13 CAD Contest Awards, among others. He is an IEEE Fellow.
Enquiries: Miss Evelyn Lee at tel 3943 8444
For more information, please refer to http://www.cse.cuhk.edu.hk/seminar.